| Primary Use | Large-part inspection, dimensional screening, and presence/absence checks | Component inspection, connector measurement, and assembly verification | High-accuracy dimensional measurement and profile inspection | Small-feature measurement, micro-components, and fine surface inspection |
| Typical Working Distance | 100–200 mm | 80–120 mm | 60–110 mm | 40–80 mm |
| Object-Side Telecentricity | Typically below 0.2° | Typically below 0.15° | Typically below 0.1° | Typically below 0.1° |
| Perspective Error | Low; generally suitable for routine dimensional inspection | Very low; suitable for repeatable edge and hole measurements | Extremely low; preferred when part height variation must not change apparent size | Extremely low, but alignment and focusing become more critical |
| Typical Distortion | Approximately <0.1% to 0.3% | Approximately <0.1% to 0.2% | Approximately <0.05% to 0.1% | Approximately <0.05% to 0.1% |
| Typical Depth of Field | Relatively high; often preferred for uneven or large parts | Moderate to high, depending on numerical aperture and f-number | Moderate; stopping down can improve depth of field at the expense of light | Limited; precise Z-axis control is commonly required |
| Recommended Sensor Coverage | Medium to large sensors, selected according to the required field of view | Commonly compatible with 1-inch to APS-C-class sensors | Often optimized for 1-inch, APS-C, or similar machine-vision sensors | Usually selected for smaller fields of view and high pixel sampling |
| Field of View at a 12 mm Sensor Width | Approximately 40–120 mm, depending on magnification | Approximately 24–40 mm | Approximately 12–24 mm | Approximately 6–12 mm |
| Image-Space Telecentricity | May be non-telecentric or partially telecentric | Often near-telecentric in industrial designs | Frequently telecentric or near-telecentric for stable sensor illumination | Design-dependent; verify compatibility with the camera and illumination system |
| Optical Resolution | Typically adequate for coarse edges and large features | Suitable for general machine-vision measurement | Designed for high-contrast edges and repeatable sub-pixel measurement | High feature sampling, but performance depends strongly on diffraction, focus, and sensor pixel size |
| Illumination Compatibility | Coaxial, ring, and diffuse front lighting are commonly used | Ring, bar, dome, and telecentric backlighting are commonly used | Telecentric backlighting, coaxial lighting, and controlled diffuse illumination are preferred | Coaxial, dark-field, and specialized narrow-angle lighting may be required |
| Measurement Repeatability | Good when part position and height are controlled | Very good for routine dimensional inspection | Excellent when calibrated with stable mechanics and controlled lighting | Excellent for small features, provided focus and vibration are tightly controlled |
| Typical Trade-Off | Large field of view but lower pixel-level detail | Balanced field of view, working distance, and measurement performance | Best balance for precision metrology, with higher cost and tighter setup requirements | High detail but smaller field of view, reduced depth of field, and greater sensitivity to alignment |
| Best Choice When | The part is large, depth variation is significant, and measurement tolerance is moderate | A single lens must handle a broad range of common inspection tasks | Dimensional accuracy, low perspective error, and repeatability are the primary priorities | Features are very small and the inspection system can provide accurate focus and positioning |