| 1 | General Machine Vision | Fixed focal-length machine vision lens | Visible light, approximately 400–700 nm | Image circle must fully cover the sensor; low distortion is preferred for dimensional inspection | C-mount is widely used; other mounts are available for larger sensors | Part presence, surface inspection, labeling, and basic assembly checks | Sensor coverage, minimum working distance, distortion, and edge sharpness |
| 2 | High-Precision Measurement | Telecentric measurement lens | Visible light, approximately 400–700 nm | Object-space telecentricity and stable magnification across the working-depth range | C-mount, F-mount, or manufacturer-specific industrial mounts | Dimensional gauging, bore measurement, connector inspection, and precision parts | Telecentricity angle, distortion percentage, magnification error, and depth of field |
| 3 | Fast Conveyor Inspection | High-speed fixed lens or line-scan lens | Visible light, approximately 400–700 nm | High light transmission, short exposure support, and minimal motion blur contribution | C-mount for many area-scan systems; line-scan mounts vary by sensor format | Web inspection, packaging lines, print inspection, and continuous material monitoring | Relative illumination, aperture range, image quality at the required line rate, and thermal stability |
| 4 | Large-Sensor Imaging | Large-format industrial lens | Visible light, approximately 400–700 nm | Image circle must exceed the diagonal of the selected sensor format | F-mount, M42, M58, or other large-format interfaces | Wide-area inspection, logistics measurement, robotic guidance, and large components | Image-circle diameter, corner resolution, vignetting, and mechanical clearance |
| 5 | Near-Infrared and SWIR Imaging | Infrared-corrected industrial lens | Common SWIR band: approximately 0.9–1.7 μm | Focus shift must be controlled at the operating wavelength, not only in visible light | C-mount, F-mount, or dedicated SWIR camera interfaces | Moisture detection, semiconductor inspection, material sorting, and silicon-wafer analysis | Transmission at the target wavelength, focus stability, sensor coverage, and chromatic shift |
| 6 | Ultraviolet Inspection | UV-compatible fused-silica or quartz lens | UV-A commonly covers approximately 315–400 nm | Optical materials and coatings must be rated for the selected UV wavelength | C-mount or specialized UV camera interfaces | Fluorescent inspection, coating verification, contamination detection, and security marking checks | UV transmission, coating durability, focus position, fluorescence compatibility, and image uniformity |
| 7 | Harsh-Environment Automation | Ruggedized or sealed machine vision lens | Visible or near-infrared, depending on the camera and lighting | Vibration resistance, locking controls, protective housing, and suitable environmental sealing | C-mount and other industrial mounts with locking or clamping provisions | Robotics, welding cells, food processing, outdoor equipment, and dusty production areas | Operating temperature, vibration test data, ingress protection of the complete assembly, and focus-lock performance |